CompuEye


Ehab Bakr @ Plant Protection Research Institute

Overview

Measured variables disease, surface
Operating system windows
Licence freeware
Automation level automated
Plant requirements any
Export formats unknown
Other information -

Scientific article(s)

A new software for measuring leaf area, and area damaged by Tetranychus urticae Koch
E. M. Bakr
Journal of Applied Entomology, 2017 View paper

Description

The Compu Eye, Leaf and Symptoms software provides an easy method to measure total leaf area and the area of any visible symptom on the leaf.


Source: Bakr (2005) Journal of Applied Entomology 129 (3), 173-175.

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